Semiconductor device measurements
| Permalink: | http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:21326/Similar |
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| Glavni autor: | Mulvey, John (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Tektronix, Inc,
1969.
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| Izdanje: | 1. neprom. izd |
| Nakladnička cjelina: |
Measure Concepts / Tektronix, Inc..
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APA stil citiranja
Mulvey, J. (1969). Semiconductor device measurements: Semiconductor device measurements (1. neprom. izd.). Tektronix, Inc.
Chicago stil citiranjaMulvey, John. Semiconductor device measurements: Semiconductor device measurements. 1. neprom. izd. Tektronix, Inc, 1969.
MLA stil citiranjaMulvey, John. Semiconductor device measurements: Semiconductor device measurements. 1. neprom. izd. Tektronix, Inc, 1969.