Semiconductor device measurements
| Permalink: | http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:21326/Details |
|---|---|
| Glavni autor: | Mulvey, John (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Tektronix, Inc,
1969.
|
| Izdanje: | 1. neprom. izd |
| Nakladnička cjelina: |
Measure Concepts / Tektronix, Inc..
|
| LEADER | 00501nam a2200181uu 4500 | ||
|---|---|---|---|
| 008 | s1969 xxua |||||||||| ||eng|d | ||
| 035 | |a HR-ZaFER 25650 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 100 | 1 | |9 25196 |a Mulvey, John | |
| 245 | |a Semiconductor device measurements. | ||
| 250 | |a 1. neprom. izd. | ||
| 260 | |b Tektronix, Inc., |c 1969. | ||
| 300 | |a 156 str. : |b ilustr. ; |c 23 cm. | ||
| 490 | |a Measure Concepts / Tektronix, Inc.. | ||
| 942 | |b BKS |c K | ||
| 990 | |a 24587 | ||
| 999 | |c 21326 |d 21326 | ||