|
|
|
|
| LEADER |
01078nam a2200277 i 4500 |
| 001 |
0013443 |
| 003 |
HR-ZaIRB |
| 005 |
20110517105845.0 |
| 008 |
981125s1985 -usa |||||||||||||eng d |
| 020 |
|
|
|a 0931837111
|
| 035 |
|
|
|z 17133
|
| 040 |
|
|
|a HR-ZaIRB
|b hrv
|c HR-ZaIRB
|e ppiak
|
| 245 |
0 |
0 |
|a Microscopic identification of electronic defects in semiconductors :
|b symposium held April 15-18, San Francisco, California, U.S.A. /
|c editors Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
|
| 260 |
|
|
|a Pittsburgh, Pennsylvania :
|b Materials Research Society,
|c cop. 1985.
|
| 300 |
|
|
|a xv, 603 str. :
|b ilustr. ;
|c 24 cm.
|
| 490 |
1 |
|
|a Materials Research Society symposia proceedings ;
|v vol. 46
|
| 504 |
|
|
|a Bibliografija i sažetak uz svaki rad.
|
| 653 |
|
|
|a microscope
|a microscopy
|
| 700 |
1 |
|
|4 edt
|a Johnson, Noble M.
|
| 700 |
1 |
|
|4 edt
|a Bishop, Stephen G.
|
| 700 |
1 |
|
|4 edt
|a Watkins, George
|
| 830 |
|
0 |
|a Materials Research Society symposia proceedings ;
|v vol. 46
|
| 942 |
|
|
|c BOOK
|
| 960 |
|
|
|a Pivac, Branko
|
| 998 |
|
|
|c Meliščak Zlodi, Iva
|
| 999 |
|
|
|c 13475
|d 13475
|
