APA stil citiranja

Johnson, N. M., Bishop, S. G., & Watkins, G. (1985). Microscopic identification of electronic defects in semiconductors: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, San Francisco, California, U.S.A. Pittsburgh, Pennsylvania: Materials Research Society.

Chicago stil citiranja

Johnson, Noble M., Stephen G. Bishop, and George Watkins. Microscopic identification of electronic defects in semiconductors: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, San Francisco, California, U.S.A. Pittsburgh, Pennsylvania: Materials Research Society, 1985.

MLA stil citiranja

Johnson, Noble M., Stephen G. Bishop, and George Watkins. Microscopic identification of electronic defects in semiconductors: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, San Francisco, California, U.S.A. Pittsburgh, Pennsylvania: Materials Research Society, 1985.