CTL for test information of digital ICs

Permalink: http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:47501/Similar
Glavni autor: Kapur, Rohit (-)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Boston : Kluwer Academic Publishers, 2003.
Predmet:

APA stil citiranja

Kapur, R. (2003). CTL for test information of digital ICs: CTL for test information of digital ICs. Boston: Kluwer Academic Publishers.

Chicago stil citiranja

Kapur, Rohit. CTL for test information of digital ICs: CTL for test information of digital ICs. Boston: Kluwer Academic Publishers, 2003.

MLA stil citiranja

Kapur, Rohit. CTL for test information of digital ICs: CTL for test information of digital ICs. Boston: Kluwer Academic Publishers, 2003.