|
|
|
|
| LEADER |
00702cam a22002174a 4500 |
| 005 |
20180215091931.0 |
| 008 |
020917s2003 maua 000 0 eng |
| 020 |
|
|
|a 1402072937
|
| 040 |
|
|
|a DLC
|c DLC
|d HR-ZaFER
|b hrv
|e ppiak
|
| 041 |
|
|
|a eng
|
| 042 |
|
|
|a pcc
|
| 050 |
0 |
0 |
|a TK7874.65
|b .K35 2003
|
| 082 |
0 |
0 |
|a 621.3815/48
|2 21
|
| 100 |
1 |
|
|a Kapur, Rohit.
|9 39017
|
| 245 |
1 |
0 |
|a CTL for test information of digital ICs /
|c by Rohit Kapur.
|
| 260 |
|
|
|a Boston :
|b Kluwer Academic Publishers,
|c 2003.
|
| 300 |
|
|
|a ix, 173 str. :
|b ilustr. ;
|c 24 cm.
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing
|x Standards.
|9 39018
|
| 650 |
|
0 |
|a Computer hardware description languages.
|9 39019
|
| 942 |
|
|
|2 udc
|c K
|
| 999 |
|
|
|c 47501
|d 47501
|
