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20130713153517.0 |
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t| |
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780331d19701993nyuar 1 a0eng c |
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|a 82640313
|z 76180194
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|a 0735-0791
|2 1
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|a ARLPBI
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| 035 |
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|a (OCoLC)ocm03766693
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| 040 |
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|a OTU
|c OTU
|d DLC
|d NSDP
|d NST
|d DLC
|d NST
|d AIP
|d NST
|d OCoLC
|d InU
|d NST
|d OCoLC
|d NST
|d OCoLC
|d NST
|d MCM
|d DLC
|d NSDP
|d OUCA
|d MCM
|d OCoLC
|d MCM
|d AMAZN
|d OCoLC
|b hrv
|e ppiak
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| 042 |
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|a pcc
|a nsdp
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| 050 |
0 |
0 |
|a TK7870
|b .S95
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| 082 |
0 |
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|a 621.381
|2 19
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| 111 |
2 |
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|a International Reliability Physics Symposium.
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| 210 |
0 |
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|a Reliab. phys.
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| 222 |
|
0 |
|a Reliability physics
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| 245 |
1 |
0 |
|a Reliability physics.
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| 260 |
|
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|a New York, N.Y. :
|b Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers,
|c -c1993.
|
| 300 |
|
|
|a v. :
|b ill. ;
|c 28 cm.
|
| 310 |
|
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|a Annual
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| 362 |
1 |
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|a Began with: 8th (Apr. 7-10, 1970).
|
| 362 |
0 |
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|a -31st (March 23-25, 1993).
|
| 500 |
|
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|a Description based on: 19th (Apr. 7-9, 1981).
|
| 510 |
0 |
|
|a Chemical abstracts
|x 0009-2258
|
| 530 |
|
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|a Also issued online.
|
| 550 |
|
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|a Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, <1974-1978>; the IEEE Electron Devices Society and the IEEE Reliability Society, <1981>-1993.
|
| 590 |
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|a SERBIB/SERLOC merged record
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Reliability
|v Congresses.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Integrated circuits
|x Reliability
|v Congresses.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Electron Devices Society.
|
| 710 |
2 |
|
|a IEEE Reliability Group.
|
| 710 |
2 |
|
|a IEEE Reliability Society.
|
| 710 |
2 |
|
|a Institute of Electrical and Electronics Engineers.
|b Electron Devices Group.
|
| 776 |
0 |
8 |
|i Online version:
|a International Reliability Physics Symposium.
|t Reliability physics
|w fer.(OCoLC)573010707
|
| 780 |
0 |
0 |
|a Reliability Physics Symposium.
|t Proceedings
|
| 785 |
0 |
0 |
|t IEEE international reliability physics proceedings
|x 1082-7285
|w fer.(DLC) 95647571
|w fer.(OCoLC)30847997
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| 850 |
|
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|a AzU
|a CLU-P
|a CSt
|a CU
|a CU-A
|a CU-I
|a CU-S
|a CaAEU
|a CaMWU
|a CaNBFU
|a CaOTU
|a CoFS
|a CoU
|a DLC
|a FU
|a GAT
|a ICIU
|a IaAS
|a IaU
|a InLP
|a InU
|a KyU
|a LU
|a MdU
|a MiDW
|a MoKL
|a MsSM
|a NNC
|a NRU
|a NcD
|a NcRS
|a NjP
|a OU
|a OrCS
|a PPD
|a PU
|a TxCM
|a TxDaM
|a UPB
|a UU
|a ViBlbV
|
| 906 |
|
|
|a 7
|b cbc
|c serials
|d 2
|e ncip
|f 19
|g n-oclcserc
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| 942 |
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|2 udc
|c K
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| 999 |
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|c 36176
|d 36176
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