Posjedovanje: 28th annual proceedings reliability physics

Permalink:	http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:36133
Ostali autor:	International Reliability Physics Symposium (-), IEEE Electron Devices Society, IEEE Reliability Group, IEEE Reliability Society, Institute of Electrical and Electronics Engineers. Electron Devices Group
Vrsta građe:	Serijska građa
Jezik:	eng
Impresum:	New Orleans Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, -c1990.
Predmet:	Electronic apparatus and appliances > Reliability > Congresses. Electronic apparatus and appliances > Testing > Congresses. Integrated circuits > Reliability > Congresses. Integrated circuits > Testing > Congresses.

Signatura:	5394
Primjerak 5394	Dostupno