Permalink:	http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:36134/Similar
Ostali autor:	IEEE Electron Devices Society (-), IEEE Reliability Society, International Reliability Physics Symposium
Vrsta građe:	Serijska građa
Jezik:	eng
Impresum:	Piscataway, N.J. : The Societies, 1995.
Predmet:	Electronic apparatus and appliances > Reliability > Congresses. Electronic apparatus and appliances > Testing > Congresses. Integrated circuits > Reliability > Congresses. Integrated circuits > Testing > Congresses.

APA stil citiranja

(1995). IEEE international reliability physics proceedings: IEEE international reliability physics proceedings. Piscataway, N.J.: The Societies.

Chicago stil citiranja

IEEE international reliability physics proceedings: IEEE international reliability physics proceedings. Piscataway, N.J.: The Societies, 1995.

MLA stil citiranja

IEEE international reliability physics proceedings: IEEE international reliability physics proceedings. Piscataway, N.J.: The Societies, 1995.