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From contamination to defects, faults, and yield loss

Permalink: http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:34706/Similar
Glavni autor: Khare, Jitendra B. (-)
Ostali autori: Maly, W. (-)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Boston : Kluwer Academic Publishers, c1996.
Nakladnička cjelina: Frontiers in electronic testing
Predmet:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Defects.
Integrated circuits > Very large scale integration > Computer simulation.
Computer-aided design.
Online pristup: Publisher description
Table of contents only

APA stil citiranja

Khare, J. B., & Maly, W. (1996). From contamination to defects, faults, and yield loss: From contamination to defects, faults, and yield loss : simulation and applications. Boston: Kluwer Academic Publishers.

Chicago stil citiranja

Khare, Jitendra B., and W. Maly. From contamination to defects, faults, and yield loss: From contamination to defects, faults, and yield loss : simulation and applications. Boston: Kluwer Academic Publishers, 1996.

MLA stil citiranja

Khare, Jitendra B., and W. Maly. From contamination to defects, faults, and yield loss: From contamination to defects, faults, and yield loss : simulation and applications. Boston: Kluwer Academic Publishers, 1996.

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