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01441cam a2200313 a 4500 |
| 005 |
20130713153412.0 |
| 008 |
960220s1996 maua b 001 0 eng |
| 010 |
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|a 96005441
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| 020 |
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|a 0792397142 (acidfree paper)
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| 040 |
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|a DLC
|c DLC
|d HR-ZaFER
|b hrv
|e ppiak
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| 050 |
0 |
0 |
|a TK7874.75
|b .K47 1996
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| 082 |
0 |
0 |
|a 621.3815/2/0685
|2 20
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| 100 |
1 |
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|a Khare, Jitendra B.
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| 245 |
1 |
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|a From contamination to defects, faults, and yield loss :
|b simulation and applications /
|c by Jitendra B. Khare, Wojciech Maly.
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| 260 |
|
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|a Boston :
|b Kluwer Academic Publishers,
|c c1996.
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| 300 |
|
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|a 150 p. :
|b ill. ;
|c 24 cm.
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| 440 |
|
0 |
|a Frontiers in electronic testing
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| 504 |
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
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| 650 |
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0 |
|a Integrated circuits
|x Very large scale integration
|x Defects.
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| 650 |
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0 |
|a Integrated circuits
|x Very large scale integration
|x Computer simulation.
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| 650 |
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0 |
|a Computer-aided design.
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| 700 |
1 |
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|a Maly, W.
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| 856 |
4 |
2 |
|3 Publisher description
|u http://www.loc.gov/catdir/enhancements/fy0813/96005441-d.html
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| 856 |
4 |
1 |
|3 Table of contents only
|u http://www.loc.gov/catdir/enhancements/fy0813/96005441-t.html
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| 906 |
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|a 7
|b cbc
|c orignew
|d 1
|e ocip
|f 19
|g y-gencatlg
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| 942 |
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|2 udc
|c K
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| 955 |
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|a pc05 to ja00 02-20-96; jf06 to subj 02-21-96; jf08 02-21-96 to SL;jf12 02-21-96;aa05 02-22-96; CIP ver. pv07 05-06-96
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| 999 |
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|c 34706
|d 34706
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