Scanned probe microscopy
| Permalink: | http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:10338/Similar |
|---|---|
| Ostali autori: | Wickramasinghe, H. Kumar (Editor) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Woodbury :
American Institute of Physics,
1992.
|
| Izdanje: | 1. izd |
APA stil citiranja
Wickramasinghe, H. K. (1992). Scanned probe microscopy: Scanned probe microscopy : AIP CONFERENCE PROCEEDINGS 241., SANTA BARBARA, CA. 1991 (1. izd.). Woodbury: American Institute of Physics.
Chicago stil citiranjaWickramasinghe, H. Kumar. Scanned probe microscopy: Scanned probe microscopy : AIP CONFERENCE PROCEEDINGS 241., SANTA BARBARA, CA. 1991. 1. izd. Woodbury: American Institute of Physics, 1992.
MLA stil citiranjaWickramasinghe, H. Kumar. Scanned probe microscopy: Scanned probe microscopy : AIP CONFERENCE PROCEEDINGS 241., SANTA BARBARA, CA. 1991. 1. izd. Woodbury: American Institute of Physics, 1992.