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00680nam a2200181uu 4500 |
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s1992 xxua |||||||||| ||eng|d |
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|a HR-ZaFER 11887
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| 040 |
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|a HR-ZaFER
|b hrv
|c HR-ZaFER
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| 041 |
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|a eng
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| 080 |
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|a 621.385.833
|h CIJEVI SA UPRAVLJANIM ELEKTONSKIM SNOPOM (MLAZOM)
|j ELEKTRONSKI MIKROSKOPI. DIFRAKCIONE KAMERE
|e 621.385.83
|9 1218
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| 245 |
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|a Scanned probe microscopy :
|b AIP CONFERENCE PROCEEDINGS 241., SANTA BARBARA, CA. 1991..
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|a 1. izd.
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|a Woodbury :
|b American Institute of Physics,
|c 1992.
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|a X, 563 str. :
|b ilustr. ;
|c 24 cm.
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| 700 |
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|9 14698
|a Wickramasinghe, H. Kumar
|4 edt
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| 942 |
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|b BKS
|c K
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| 990 |
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|a 11660
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| 999 |
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|c 10338
|d 10338
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