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20131227102025.0 |
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130211s2011 ci | |||| ||eng |
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|a (HR-ZaNSK)000832339
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|a HR-ZaNSK
|b hrv
|c HR-ZaNSK
|e ppiak
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0 |
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|a eng
|b hrv
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|a croatica
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|a ci
|c hr
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| 080 |
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|a 621.3
|2 MRF 1998.
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| 100 |
1 |
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|a Bahun, Ivan
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| 245 |
1 |
0 |
|a Real-time measurement of IGBT’s operating temperature /
|c Ivan Bahun, Neven Čobanov, Željko Jakopović.
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| 246 |
3 |
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|a Insulated-Gate Bipolar Transistor
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| 300 |
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|b Ilustr.
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| 504 |
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|a Bibliografija: 18 jed.
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| 504 |
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|a Sažetak
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| 653 |
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0 |
|a IGBT
|a Bipolarni tranzistor
|a Mjerenje
|a Napon praga
|a Temperatura
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| 700 |
1 |
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|a Čobanov, Neven,
|c inženjer elektrotehnike
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| 700 |
1 |
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|a Jakopović, Željko,
|c fizičar
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| 773 |
0 |
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|t Automatika (Zagreb)
|x 0005-1144
|g 52 (2011), 4 ; str. 295-305
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| 981 |
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|b B11/11
|p CRO
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| 998 |
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|a rpeo130211
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| 856 |
4 |
2 |
|u http://hrcak.srce.hr/index.php?show=clanak&id_clanak_jezik=116403
|y Elektronička verzija članka
|