Improved non-parametric subtraction for detection of wafer defect
| Permalink: | http://skupnikatalog.nsk.hr/Record/nsk.NSK01000676906/Details |
|---|---|
| Matična publikacija: |
ISPA .. 5 (2007) ; str. 464-468 |
| Glavni autor: | Kim, Hye Won (-) |
| Ostali autori: | Yoo, Suk In (-) |
| Vrsta građe: | Članak |
| Jezik: | eng |
| Predmet: |
| LEADER | 00941caa a2200277 ir4500 | ||
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| 001 | NSK01000676906 | ||
| 003 | HR-ZaNSK | ||
| 005 | 20101122100841.0 | ||
| 007 | ta | ||
| 008 | 080925s2007 ci ||| ||eng | ||
| 035 | |9 (HR-ZaNSK)679279 | ||
| 035 | |a (HR-ZaNSK)000676906 | ||
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| 042 | |a croatica | ||
| 080 | |a 621.3 |2 MRF 1998. | ||
| 080 | |a 004 |2 MRF 1998. | ||
| 100 | 1 | |a Kim, Hye Won | |
| 245 | 1 | 0 | |a Improved non-parametric subtraction for detection of wafer defect / |c Hye Won Kim, Suk In Yoo. |
| 300 | |b Ilustr. | ||
| 500 | |a 5th International Symposium on Image and Signal Processing and analysis, Istanbul, Turkey, September 27-29, 2007 | ||
| 504 | |a Bibliografija: 9 jed | ||
| 653 | |a Integrirani sklopovi |a Numerička simulacija | ||
| 700 | 1 | |a Yoo, Suk In | |
| 773 | 0 | |t ISPA ... |x 1845-5921 |g 5 (2007) ; str. 464-468 |w nsk.(HR-ZaNSK)000572126 | |
| 981 | |b B08/07 | ||
| 998 | |a rado080925 |c rpeo101122 | ||