Ellipsometry at the nanoscale
| Permalink: | http://skupnikatalog.nsk.hr/Record/irb.103405/Details |
|---|---|
| Ostali autori: | Losurdo, Maria (Editor), Hingerl, Kurt |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Heidelberg ; New York ; Dordrecht ; London :
Springer,
2013.
|
| Predmet: |
| LEADER | 00757nam a2200217 i 4500 | ||
|---|---|---|---|
| 001 | 103405 | ||
| 003 | HR-ZaIRB | ||
| 005 | 20130628160223.0 | ||
| 008 | 130628s2013 gw ||||fr|||| 001 0 eng d | ||
| 020 | |a 9783642339554 | ||
| 040 | |a HR-ZaIRB |b hrv |c HR-ZaIRB |e ppiak | ||
| 080 | |a 535 | ||
| 245 | 0 | 0 | |a Ellipsometry at the nanoscale / |c Maria Losurdo, Kurt Hingerl editors. - |
| 260 | |c 2013. |b Springer, |a Heidelberg ; |a New York ; |a Dordrecht ; |a London : | ||
| 300 | |a XXIV, 730 str. : |b ilustr. ; |c 25 cm. | ||
| 653 | |a ellipsometry in nanoscience |a nanotechnology |a optical diagnostics |a polarimetry |a semiconductors and flexible electronics | ||
| 700 | 1 | |4 edt |a Losurdo, Maria | |
| 700 | 1 | |4 edt |a Hingerl, Kurt | |
| 942 | |c BOOK | ||
| 998 | |c Mihalić, Mirjana | ||
| 999 | |c 25589 |d 25589 | ||