LEADER 01127nam a2200253 i 4500
001 103258
003 HR-ZaIRB
005 20121107135011.0
008 121030s2007 -u ||||fr|||| 001 0 eng d
020 |a 9780387286679 
040 |a HR-ZaIRB  |b hrv  |c HR-ZaIRB  |e ppiak 
080 |a 53.086 
245 0 0 |a Scanning probe microscopy :  |b electrical and electromechanical phenomena at the nanoscale :  |c Sergei Kalinin, Alexei Gruverman, editors. -  |n vol. 1 / 
260 |b Springer,  |c 2007.  |a New York : 
300 |a XX, 558 str. :  |b ilustr. ;  |c 24 cm. 
504 |a Bibliografija iza svakog poglavlja. - 
504 |a Kazalo. 
653 |a SPM techniques for electrical characterization  |a electrical and electromechanical imaging  |a semiconductors  |a nanotubes and nanotubes networks  |a multi-probe scanning tunneling microscopy 
700 1 |4 edt  |a Kalinin, Sergei  |b    |9 2747 
700 1 |4 edt  |a Gruverman, Alexei  |9 2748 
856 4 1 |u http://books.google.hr/books?id=Ua8fxzc2kTwC&pg=PA690&dq=9780387286679&hl=en&sa=X&ei=71iaUObYCcWChQfavoDIDA&redir_esc=y#v=onepage&q=9780387286679&f=false 
942 |c BOOK 
998 |c Mihalić, Mirjana 
999 |c 25441  |d 25441