Point defects in semiconductors II

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Glavni autori: Bourgoin, J. (Author), Lannoo, M.
Vrsta građe: Knjiga
Jezik: eng
Impresum: Berlin [etc.] : Springer-Verlag, 1983.
Nakladnička cjelina: Springer Series in Solid-State Sciences / editors M. Cardona ... [et al.] ; vol. 44
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040 |a HR-ZaIRB  |b hrv  |c HR-ZaIRB  |e ppiak 
100 1 |4 aut  |a Bourgoin, J. 
245 1 0 |a Point defects in semiconductors II :  |b experimental aspects /  |c  J. Bourgoin, M Lannoo ; with a foreword by G. D. Watkins. 
260 |a Berlin [etc.] :   |b Springer-Verlag,   |c 1983. 
300 |a XVI, 295 str. :   |c 25 cm. 
490 1 |a Springer Series in Solid-State Sciences / editors M. Cardona ... [et al.] ;   |v vol. 44 
504 |a Bibliografija: str. 271-281. 
700 1 |4 aut  |a Lannoo, M. 
830 0 |a Springer Series in Solid-State Sciences / editors M. Cardona ... [et al.] ;   |v vol. 44 
942 |c BOOK 
960 |a Pivac, Branko 
999 |c 9325  |d 9325