Infrared ellipsometry on semiconductor layer structures

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Glavni autor: Schubert, Matias (Author)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Berlin [etc.] : Springer, cop. 2004.
Nakladnička cjelina: Springer tracts in modern physics, ISSN 0081-3869 ; 209
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040 |a HR-ZaIRB  |b hrv  |c HR-ZaIRB  |e ppiak 
080 |a 535.5:621.315.592 
100 1 |4 aut  |a Schubert, Matias 
245 1 0 |a Infrared ellipsometry on semiconductor layer structures :  |b phonons, plasmons, and polaritons /  |c Mathias Schubert. 
260 |a Berlin [etc.] :   |b Springer,   |c cop. 2004. 
300 |a XI, 193 str. :   |b ilustr. ;   |c 24 cm. 
490 1 |a Springer tracts in modern physics, ISSN 0081-3869 ;   |v 209 
504 |a Bibliografija. 
653 |a ellipsometry  |a semiconductors 
830 0 |a Springer tracts in modern physics, ISSN 0081-3869 ;   |v 209 
942 |c BOOK 
998 |c Konjević, Sofija 
999 |c 4750  |d 4750