Anomalous x ray scattering for materials characterization
| Permalink: | http://skupnikatalog.nsk.hr/Record/irb.0003717/Similar |
|---|---|
| Glavni autor: | Waseda, Yoshio (Author) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Berlin [etc.] :
Springer,
cop. 2002.
|
| Nakladnička cjelina: |
Springer tracts in modern physics, ISSN 0081-3869 ;
179 |
| Predmet: |
APA stil citiranja
Waseda, Y. (2002). Anomalous x ray scattering for materials characterization: Anomalous x ray scattering for materials characterization : atomic scale structure determination. Berlin [etc.]: Springer.
Chicago stil citiranjaWaseda, Yoshio. Anomalous x ray scattering for materials characterization: Anomalous x ray scattering for materials characterization : atomic scale structure determination. Berlin [etc.]: Springer, 2002.
MLA stil citiranjaWaseda, Yoshio. Anomalous x ray scattering for materials characterization: Anomalous x ray scattering for materials characterization : atomic scale structure determination. Berlin [etc.]: Springer, 2002.