Semiconductor material and device characterization

Permalink: http://skupnikatalog.nsk.hr/Record/irb.0003158/Details
Glavni autor: Schroder, Dieter K. (Author)
Vrsta građe: Knjiga
Jezik: eng
Impresum: New York [etc.] : John Wiley, 1998.
Izdanje: 2nd ed
Nakladnička cjelina: A Wiley-Interscience Publication
Predmet:
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001 0003158
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005 20110517105418.0
008 010704s1998 -usa |||||||||||||eng d
020 |a 0471241393 
035 |z 3906 
040 |a HR-ZaIRB  |b hrv  |c HR-ZaIRB  |e ppiak 
080 |a 621.382 
100 1 |4 aut  |a Schroder, Dieter K. 
245 1 0 |a Semiconductor material and device characterization /  |c Dieter K. Schroder. 
250 |a 2nd ed. 
260 |a New York [etc.] :   |b John Wiley,   |c 1998. 
300 |a XXIV, 760 str. :   |b ilustr. ;   |c 24 cm. 
490 1 |a A Wiley-Interscience Publication 
504 |a Bibliografija. 
653 |a semiconductors  |a solid state 
830 0 |a A Wiley-Interscience Publication 
942 |c BOOK 
960 |a Pivac, Branko  |c Rado Rn 060IRB1-R 
998 |c Gračan, Višnja 
999 |c 3190  |d 3190