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000626s1999 gw a |||||||||||||eng d |
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|a 354062029X
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|z 3470
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|a HR-ZaIRB
|b hrv
|c HR-ZaIRB
|e ppiak
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|a 538.9
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| 100 |
1 |
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|4 aut
|a Holy, Vaclav
|
| 245 |
1 |
0 |
|a High resolution x- ray scattering from thin films and multilayers /
|c Vaclav Holy, Ulrich Pietsch, Tilo Baumbach.
|
| 260 |
|
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|a Berlin [etc.] :
|b Springer,
|c 1999.
|
| 300 |
|
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|a XI, 256 str. :
|b ilustr. ;
|c 25 cm.
|
| 490 |
1 |
|
|a Springer tracts in modern physics ;
|v 149
|
| 504 |
|
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|a Bibliografija.
|
| 653 |
|
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|a X-ray diffraction
|a optical propreties
|
| 700 |
1 |
|
|4 aut
|a Pietsch, Ulrich
|
| 700 |
1 |
|
|4 aut
|a Baumbach, Tilo
|
| 830 |
|
0 |
|a Springer tracts in modern physics ;
|v 149
|
| 942 |
|
|
|c BOOK
|
| 960 |
|
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|a Juraić, Krunoslav
|
| 998 |
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|c Konjević, Sofija
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| 999 |
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|c 2792
|d 2792
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