Diagnostic techniques for semiconductor materials processing II

Permalink: http://skupnikatalog.nsk.hr/Record/irb.0001866/Details
Ostali autori: Pang, Stella W. (Editor)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Pittsburgh, Penn. : Materials Research Society, [1996].
Nakladnička cjelina: Symposium Proceedings ; Volume 406
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245 0 0 |a Diagnostic techniques for semiconductor materials processing II :  |b symposium held November 27-30, 1995, Boston, Mass. /  |c editors Stella W. Pang ... [et al.]. 
260 |a Pittsburgh, Penn. :   |b Materials Research Society,   |c [1996]. 
300 |a XV, 585 str. :   |b ilustr. ;   |c 24 cm. 
490 1 |a Symposium Proceedings ;   |v Volume 406 
653 |a techniques 
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830 0 |a Symposium Proceedings ;   |v Volume 406 
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998 |c Borić, Vesna 
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