IEEE transactions on device and materials reliability
| Permalink: | http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:44276/Details |
|---|---|
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
New York, NY
IEEE,
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| LEADER | 00637nam a2200193 u 4500 | ||
|---|---|---|---|
| 003 | HR-ZaFER | ||
| 005 | 20150702103435.0 | ||
| 008 | 150410 ||| eng | ||
| 022 | |a 1558-2574 | ||
| 040 | |d HR-ZaFER |a HR-ZaFER |b hrv |c HR-ZaFER |e ppiak | ||
| 041 | 0 | 7 | |a eng |2 ISO 639-2 |
| 210 | 0 | 0 | |a ITDMA2 |
| 210 | 0 | 0 | |a IEEE T-DMR |
| 210 | 0 | 0 | |a IEEE Trans. Device and Materials Reliability |
| 245 | 0 | 0 | |a IEEE transactions on device and materials reliability / |
| 260 | |a New York, NY |b IEEE | ||
| 580 | |a Institute of Electrical and Electronics Engineers: IEEE transactions on device and materials reliability | ||
| 942 | |2 udc |c C |s 1 | ||
| 999 | |c 44276 |d 44276 | ||