Self-testing VLSI design

Permalink: http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:4369/Similar
Glavni autori: Yarmolik, V.N (-), Kachan, I.V (Author)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Amsterdam : Elsevier Scientific Publishing Company, 1993.
Izdanje: 1. izd

APA stil citiranja

Yarmolik, V. (1993). Self-testing VLSI design: Self-testing VLSI design (1. izd.). Amsterdam: Elsevier Scientific Publishing Company.

Chicago stil citiranja

Yarmolik, V.N. Self-testing VLSI design: Self-testing VLSI design. 1. izd. Amsterdam: Elsevier Scientific Publishing Company, 1993.

MLA stil citiranja

Yarmolik, V.N. Self-testing VLSI design: Self-testing VLSI design. 1. izd. Amsterdam: Elsevier Scientific Publishing Company, 1993.