Semiconductor measurements and instrumentation
| Permalink: | http://skupnikatalog.nsk.hr/Record/fer.KOHA-OAI-FER:27133/Details |
|---|---|
| Glavni autor: | Runyan, W. R. (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
McGraw-Hill Publishing Company,
1975.
|
| Izdanje: | 1. izd |
| Nakladnička cjelina: |
Texas Instruments Electronics Series / McGraw-Hill Publishing Company.
|
| LEADER | 00598nam a2200193uu 4500 | ||
|---|---|---|---|
| 008 | s1975 xxua |||||||||| ||eng|d | ||
| 020 | |a 0070542732 | ||
| 035 | |a HR-ZaFER 31498 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 100 | 1 | |9 28799 |a Runyan, W. R. | |
| 245 | |a Semiconductor measurements and instrumentation. | ||
| 250 | |a 1. izd. | ||
| 260 | |b McGraw-Hill Publishing Company, |c 1975. | ||
| 300 | |a vii, 280 str. : |b ilustr. i tabele ; |c 26 cm. | ||
| 490 | |a Texas Instruments Electronics Series / McGraw-Hill Publishing Company. | ||
| 942 | |b BKS |c K | ||
| 990 | |a 29426 | ||
| 999 | |c 27133 |d 27133 | ||