Preporučene teme... za Vaše pretraživanje.
Prikazuje se 1 - 20
od 30
za pretraživanje: '',
Upit obrađen za: 0.04s
Popis
Grid
Alati za pretraživanje:
RSS Feed
—
Pretraživanje pošaljite e-poštom
Ograniči pretraživanje
Ukloni opseg
Preporučene teme: Testing
Knjižnica
Vrsta građe
Signatura
Autor
3
IEEE Electron Devices Society
3
IEEE Reliability Society
3
Institute of Electrical and Electronics Engineers
3
International Reliability Physics Symposium
2
IEEE Reliability Group
2
Institute of Electrical and Electronics Engineers. Electron Devices Group
prikaži više ...
1
Association for Computing Machinery
1
Beck, Kent
1
Binder, Robert, 1950-
1
Blitz, Jack
1
Boehm, Ann E., 1938-
1
Brassard, Marla R.
1
Bâzu, M. I. (Marius I.), 1948-
1
Băjenescu, Titu I., 1938-
1
Chakravarty, Sreejit
1
Cheung, Peter Y. K.
1
Csopaki, Gyula
1
Derickson, Dennis
1
Dibuz, Sarolta
1
Dufort, Benoit, 1970-
1
Gackstatter, Erwin
1
Gao, Jerry
1
Gill, Paul, 1942-
1
Gizopoulos, Dimitris
1
Hecker, Siegfried S.
1
Hsia, Pei
1
IEEE Power Engineering Society. Power System Instrumentation and Measurements Committee
1
IEEE Symposium on Computer Software Reliability
1
IFIP TC6 International Workshop on Testing of Communicating Systems
1
Iman, Sasan
prikaži manje ...
Jezik
Područje
Godina izdanja