APA stil citiranja

Rosenauer, A. (2003). Transmission electron microscopy of semiconductor nanostructures: Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state. Berlin [etc.]: Springer.

Chicago stil citiranja

Rosenauer, Andreas. Transmission electron microscopy of semiconductor nanostructures: Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state. Berlin [etc.]: Springer, 2003.

MLA stil citiranja

Rosenauer, Andreas. Transmission electron microscopy of semiconductor nanostructures: Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state. Berlin [etc.]: Springer, 2003.